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Advances in X-Ray Analysis: Volume 34

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Advances in X-Ray Analysis: Volume 34

Advances in X-Ray Analysis: Volume 34

Peter Wobrauschek, Peter Kregsamer, Christina Streli, Hannes Aiginger (auth.), Charles S. Barrett, John V. Gilfrich, I. C. Noyan, Ting C. Huang, Paul K. Predecki (eds.)

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Categories:

Year:

1991

Publisher:

Springer US

Language:

english

Pages:

721

ISBN 10:

1461537444

ISBN 13:

9781461537441

File:

PDF, 24.38 MB

IPFS:

,

english, 1991

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Beware of he who would deny you access to information, for in his heart he dreams himself your master

— Pravin Lal

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